$B@P0f!!@5?M!J;00f6bB09[6H!K!&O7ED!!>05W!J=;M'%Y!<%/%i%$%H!K(B |
$B%(%l%/%H%m%K%/%9:`NA$K4X$9$k$9$Y$F$N8&5f$K4X$7$F!"8&5fH/I=$r8xJg$7$^$9!#FC$KH>F3BN:`NA!"%Q%C%1!<%8:`NA!"
$B:G=*99?7F|;~!'(B2009-09-07 16:39:01
$B$3$NJ,N`$G$h$/;H$o$l(B $B$F$$$k%-!<%o!<%I(B | $B%-!<%o!<%I(B | $B | |
---|---|---|---|
electrodeposition | 5$B7o(B | ||
Packaging | 3$B7o(B | ||
supercritical ammonia | 2$B7o(B | ||
Electronics | 2$B7o(B | ||
Copper | 2$B7o(B | ||
crystal growth | 2$B7o(B | ||
Cu | 2$B7o(B | ||
gallium nitride | 2$B7o(B | ||
pattern | 2$B7o(B | ||
Wafer level pakage | 1$B7o(B |
$B | $B9V1iBjL\!?H/I=$B%-!<%o!<%I(B | $B | |
---|---|---|---|
34 | $B1v2=?eAG%,%9$K$h$k;@2=%O%U%K%&%`%(%C%A%s%0(B | HfO2 hi-k | 4/18 21:54:50 |
42 | Si$B4SDLEE6K(B(TSV)$B$N9bB.(BCu$B$a$C$-(B | Copper TSV Electrodeposition | 4/21 11:10:30 |
43 | $B%9%Q%C%?%$%*%s%W%l!<%F%#%s%0K!$rMQ$$$?(BCu$B%7!<%IKl$N:n@=$HI>2A(B | Cu Seed Electoro-Migration Through Silicon Via | 4/21 11:58:17 |
45 | [$B>7BT9V1i(B]$B!!(BMEMS$BF08~(B | MEMS Life Packaging | 4/21 13:26:30 |
48 | [$B>7BT9V1i(B]$B!!M-5!%(%l%/%H%m%K%/%9!&%U%)%H%K%/%9$N:G6a$NE83+(B | Organic Device Printing | 4/21 14:08:54 |
119 | $BEE2rF | Cu electrodeposition nodule | 4/24 14:08:12 |
152 | ITO$B%J%NN3;R$rMQ$$$?%[%C%H%W%l%9K!$K$h$kF)L@F3EEKl(B | indium tin oxide hot-press nanoparticles | 4/25 13:34:03 |
153 | $BF<%J%NN3;R$rMQ$$$?F3EEKl(B | Copper nanoparticles Conductive film Inkjet | 4/25 13:45:54 |
302 | [$B>7BT9V1i(B] LED$B<~JU5;=Q$N:G?75;=QF08~$H>-MhE8K>(B | LED Electronics Packaging | 4/28 11:02:50 |
365 | $B%U%#%k%I%S%"$a$C$-$K$*$1$k%8%"%j%k%"%_%s7OE:2C:^$N8z2L(B | Copper Electrodeposition Via-filling | 4/28 15:16:42 |
429 | ZnS$B4pHD$KBP$9$k%9%k!<%[!<%k%U%#%j%s%0$a$C$-(B | ZnS deposition Cu | 4/28 18:26:30 |
444 | [$B>7BT9V1i(B]$BEE;R%Z!<%Q!u67(B | Electronics Paper Packaging | 4/28 18:56:08 |
447 | $BM-5!4pHD$rMQ$$$?HyNL%$%*%s%;%s%7%s%0$K4X$9$k4pAC8!F$(B | self-assembling monolayer sensor reproducibility | 4/28 19:03:07 |
508 | $B6dG[@~!"F | ion migration short circuit Ag, Cu wiring | 4/29 17:58:52 |
552 | $B%"%b%N%5!<%^%kK!$K$h$k(BGaN$BC17k>=0i@.$K$*$1$k6bB0?(G^$N8!F$(B | crystal growth gallium nitride supercritical ammonia | 4/30 10:22:24 |
565 | $B%"%b%N%5!<%^%kK!$K$h$k(BGaN$BC17k>=0i@.$K$*$$$F0i@.29EY!&05NO$,M?$($k1F6A(B | crystal growth gallium nitride supercritical ammonia | 4/30 10:44:02 |
642 | $BHy>.7A>u$X$N(BNi$B$a$C$-Kl$N:n@=$H7A>u@)8f(B | electrodeposition nickel pattern | 4/30 13:50:19 |
646 | $B%$%a!<%8%;%s%5! | Adhesive Photodefinable Wafer level pakage | 4/30 14:04:26 |
650 | $B%>%k%2%kK!$K$h$k;@2=0!1tF)L@F3EEKl$ND4@=(B | zinc oxide sol-gel method thin films | 4/30 14:16:44 |
671 | $B9b%"%9%Z%/%HHf%-%c%S%F%#Fb$NN.F02r@O(B | high aspect ratio bump numerical analysis | 4/30 14:39:08 |
791 | $B;@2=J*%J%N7k>=$N?eG.9g@.$H$=$NBO@Q$K$h$kEE3&8z2L%H%i%s%8%9%?$N7A@.(B | metal oxide nanocrystal drop cast field-effect transistor | 4/30 17:35:57 |
818 | FeCoNi$B;0859g6b$K$h$kHy>.9=B$J*$N:n@=$HAH@.@)8f(B | electrodeposition alloy pattern | 4/30 18:08:13 |