SCEJ 80th Annual Meeting (Tokyo, 2015): List of the applications (topics)

`SCEJ 80th Annual Meeting (Tokyo, 2015)`

List of received applications (By topics code)

6) Systems, information, and simulation technologies

6-a. Plant operation

Most recent update: 2015-07-10 15:24:01

The keywords that frequently used in this toopics code.	Keywords	Number
	Petri net	1
	abnormal behavior	1
	Particle Filter	1
	Fault Detection	1
	Process Monitoring	1
	fault avoidance control	1
	Plant-wide monitoring	1
	MISO ARX model	1

ACKN No.	Title/Author(s)	Keywords	Style
292	PF-GMM:Fault Detection based on probability distributions (TUAT) *Ide Mizuki, Yamashita Yoshiyuki	Process Monitoring Particle Filter Fault Detection	P
597	Plant-wide monitoring with Invariant analysis based on MISO ARX model including common factors for large scale plants (NEC) *Natsumeda Masanao, Asakura Takayoshi	Plant-wide monitoring MISO ARX model	O
628	Modeling and avoidance of abnormal behaviors of chemical processes by Petri nets (Nagoya U.) *Imaizumi Y., Yamakawa T., Hashizume S., Hashizume S., Yajima T., Onogi K.	abnormal behavior fault avoidance control Petri net	P

List of received applications (By topics code)

List of received applications
SCEJ 80th Annual Meeting (Tokyo, 2015)

(C) 2015 The Society of Chemical Engineers, Japan. The Society of Chemical Engineers, Japan. All rights reserved.
Most recent update: 2015-07-10 15:24:01
For more information contact Organizing Committee, SCEJ 80th Annual Meeting (Tokyo, 2015)
E-mail: inquiry-80a

www3.scej.org

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