SCEJ 80th Annual Meeting (Tokyo, 2015): Session programs

`SCEJ 80th Annual Meeting (Tokyo, 2015)`

Session programs

Systems, information, and simulation technologies

K313-K324

Most recent update: 2015-03-05 09:42:37

Time	Paper ID	Title / Authors	Keywords	Topic code	Ack. number
Hall K, Day 3
(13:00–14:00) (Chair: Hasebe S.)
13:00– 13:20	K313	[The SCEJ Award for Outstanding Young Researcher] Soft Sensors for Improvement of Control Performance in Chemical Plants (U. Tokyo) Kaneko Hiromasa		6-d	624
13:20– 13:40	K314	Plant-wide monitoring with Invariant analysis based on MISO ARX model including common factors for large scale plants (NEC) *Natsumeda Masanao, Asakura Takayoshi	Plant-wide monitoring MISO ARX model	6-a	597
13:40– 14:00	K315	A new kinetic lumping model for design of refinery process under petroleomics framework (U. Tokyo) *Nguyen Hongthuy, (JPEC) Teratani Shogo, Tanaka Ryuzo, (U. Tokyo) Hirao Masahiko	petroleomics molecular based lumping model design of refinery processes	6-b	391
(14:00–15:00) (Chair: Funatsu K.)
14:00– 14:20	K316	Kinetic Model for Expansion Culture of iPS Cells by Considering the Deviation from Undifferentiated State on Feeder Layers (Osaka U.) *Ngo X. T., Fusa S., Kino-oka M.	Deviation iPS cell Simulation	6-c	264
14:20– 14:40	K317	A method for planning regional energy system based on industrial symbiosis (U. Tokyo) *Kanematsu Y., Kikuchi Y., Okubo T.	Renewable resources Energy integration Multi-industry collaboration	6-b	602
14:40– 15:00	K318	A Mathematical Method for Extracting Parameters to be Criterion for Revision Timing in Reactive Scheduling (U. Miyazaki) *Takatsuka Kayoko, Takahashi Koki, Kubota Shinichiro, Yamaba Hisaaki, Okazaki Naonobu	reactive scheduling schedule revision limit of tolerance	6-d	671
15:00– 15:20		Break
(15:20–16:20) (Chair: Hirao M.)
15:20– 15:40	K320	Development of flatness control method for silicon wafer (SUMCO) *Mizuta Masahiko, (Kyoto U.) Kano Manabu	silicon wafer flatness control	6-e	615
15:40– 16:00	K321	Generative topographic mapping and graph theory combined approach for non-linear fault identification and diagnosis (U. Tokyo) *Escobar Matheus, Kaneko Hiromasa, Funatsu Kimito	Process Monitoring Generative Topographic Mapping Graph Theory	6-c	471
16:00– 16:20	K322	Input Variable Selection for Softsensor Design based on Weighted Nearest Correlation Spectral Clustering (Kyoto U.) *Fujiwara Koichi, Kano Manabu	Softsensor Input variable selection Spectral clustering	6-d	247
(16:20–17:00) (Chair: Kaneko H.)
16:20– 16:40	K323	Modeling, Simulation and Optimization Research for Pharmaceutical Manufacturing (U. Tokyo) Sugiyama Hirokazu	Process design Multiobjective optimization Decision-support	6-e	250
16:40– 17:00	K324	Technical requirements for virtual sensing technology application (Kyoto U.) *Kim Sanghong, Kano Manabu, Hasebe Shinji	Virtual sensing Technical requirement Industrial application	6-f	340

Technical program
SCEJ 80th Annual Meeting (Tokyo, 2015)

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Most recent update: 2015-03-05 09:42:37
For more information contact Organizing Committee, SCEJ 80th Annual Meeting (Tokyo, 2015)
E-mail: inquiry-80a

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