$B9V1i(B $B;~9o(B | $B9V1i(B $BHV9f(B | $B9V1iBjL\!?H/I= | $B%-!<%o!<%I(B | $BJ,N`(B $BHV9f(B | $B |
---|---|---|---|---|---|
$B%7%s%]%8%&%`(B $B!c(BCVD$B!&%I%i%$%W%m%;%9!d(B | |||||
(9:00$B!A(B10:00)$B!!(B($B:BD9(B $B6LCVD> | |||||
L301 | $B%7%j%3%sI=LL$K$*$1$kM-5!J*J,;R5[CeC&N%5sF0$N$=$N>l4Q;!(B | Silicon Organic compound adsorption | S-35 | 168 | |
L302 | InGaAsP$B7O(BMOVPE$B$K$*$1$k(BV$BB25[C&CeB.EY$H8GAjAH@.(B | MOVPE Crystal Growth Simulation | S-35 | 769 | |
L303 | GaAs$B$*$h$S(BInP$B$N(BMOVPE$B$K$*$1$kI=LL5[CeAX$NB.EY2aDxHf3S(B | MOVPE Surface adsorption layer kinetics | S-35 | 790 | |
(10:00$B!A(B11:00)$B!!(B($B:BD9(B $B1)?<(B $BEy(B) | |||||
L304 | $B9bB.2sE>7?(BCVD$BAuCV$rMQ$$$?(BGaAs$B@.D9%W%m%;%9$K$*$1$k(BH2/N2$B:.9g%,%9%-%c%j%"$N1F6A(B | MOCVD CHEMKIN rapid rotation reactor | S-35 | 587 | |
L305 | $BA*Br@.D9%W%m%U%!%$%k2r@O$K$h$k(BInP,InAs-MOVPE$B@.D9$NB.EYO@(B | InP/InAs-MOVPE Selective area growth Kinetics | S-35 | 687 | |
L306 | MOVPE$B$K$*$1$kI=LLH?1~B.EY$HI=LL86;R9=B$$N4X78(B | MOVPE surface reaction rate surface reconstruction | S-35 | 820 | |
(11:00$B!A(B12:00)$B!!(B($B:BD9(B $BsnF#>fLw(B) | |||||
L307 | $BBg7?(BCVD$BH?1~O'$K$h$k(BBN$B%;%i%_%C%/%99g@.(B | Pyrolitic Boron Nitride CVD Crystal growth | S-35 | 337 | |
L308 | [$BE8K>9V1i(B] 4H-SiC$BMQ9bB.(BCVD$BO'$N3+H/%3%s%;%W%H(B | 4H-SiC homo-epitaxial growth Chemical vapor deposition High-rate growth | S-35 | 424 | |
(13:00$B!A(B14:00)$B!!(B($B:BD9(B $B6aF#1Q0l(B) | |||||
L313 | $B%Q%k%9%$%s%8%'%/%7%g%sJ}<0$K$h$k9bIJ | Pulse injection method GaN MOVPE | S-35 | 755 | |
L314 | $B%Q%k%9%$%s%8%'%/%7%g%s$rMQ$$$?(BInP$B$NA*Br(BMOVPE$B@.D9$K$*$1$kC | abnormal growth Pulse Injection SA-MOVPE | S-35 | 387 | |
L315 | $B%A%?%s;@%9%H%m%s%A%&%`GvKl$N%(%T%?%-%7%c%k@.D9>r7o(B | CVD Epitaxial Growth Strontium Titanate | S-35 | 147 | |
(14:00$B!A(B15:00)$B!!(B($B:BD9(B $B0K86(B $B3X(B) | |||||
L316 | $B%Q%k%9J|EE%W%i%:%^$K$h$k(BTiO2$B$NItJ,4T85$*$h$S$=$NFC@-I>2A(B | partial reduction TiO2 plasma | S-35 | 960 | |
L317 | TiO2$BCf6uN3;R$X$N(BPLD$BK!$K$h$k6bB0C4;}(B | TiO2 hollow particle PLD metal support | S-35 | 982 | |
L318 | $BD6NW3&Fs;@2=C:AGN.BN$rMxMQ$7$?(BTi$B;@2=J*GvKl$NCJ:9HoJ$@.Kl(B | supercritical carbon dioxide thin film titanium oxide | S-35 | 499 | |
(15:00$B!A(B16:00)$B!!(B($B:BD9(B $B=);3BY?-(B) | |||||
L319 | $BD6NW3&N.BN$rMQ$$$?(BULSI$BHy:Y9&$X$N(BCu$BKd$a9~$_(B | Gap-filling Supercritical Fluid Cu | S-35 | 848 | |
L320 | $B;@2=4T85$rMxMQ$7$?(BULSI-Cu$BG[@~7A@.MQ(BCVD$B%W%m%;%9$NB.EYO@(B | CVD step coverage Cu oxide | S-35 | 452 | |
L321 | $BG.%U%#%i%a%s%H?eAG%i%8%+%k%=!<%9$K$h$k(BCu$BGvKl2~ | hot filament hydrongen radial cu thin films | S-35 | 967 |