Japanese page RELOAD
SCEJ 84th Annual Meeting (Tokyo, 2019)
Last modified: 2019-03-12 11:30:00
Program search result : Matsusaka Shuji : 3 programs
The preprints(abstracts) can be viewed by clicking the Paper IDs.
The ID/PW printed on the PROGRAM book are required.
(The ID/PW have also been sent to the Earlybird registers and invited persons by e-mail.)
The programs of HC-13, HC-17, K-1 were updated.
The ID/PW printed on the PROGRAM book are required.
(The ID/PW have also been sent to the Earlybird registers and invited persons by e-mail.)
The programs of HC-13, HC-17, K-1 were updated.
Authors field exact matches “Matsusaka Shuji”; 3 programs are found.
The search results are sorted by the start time.
| Time | Paper ID | Title / Authors | Keywords | Topic code | Ack. number |
|---|---|---|---|---|---|
| Day 3 | PE316 | Erectric field dependence of adhesive force of charged particles in external electric field | Adhesive force Airflow method External electric field | 2-f | 119 |
| Day 3 | PE325 | Photoelectric charging of dielectric particle layers and particle levitation | Photoelectric charging Dielectric particle layers Levitation | 2-f | 120 |
| Day 3 | PE327 | Analysis of stress in powder bed by constant-volume shear test and constant-load shear test | Shear test Critical state line Void fraction | 2-f | 212 |
| DispCtl: |
|---|
Technical program
Technical sessions (Wide)
(For narrow screen)
Session programs
Search in technical program
SCEJ 84th Annual Meeting (Tokyo, 2019)
© 2023 The Society of Chemical Engineers, Japan. All rights reserved.For more information contact SCEJ 84th Annual Meeting Organizing Committee
E-mail: inquiry-84a
www3.scej.org