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SCEJ 82nd Annual Meeting (Tokyo, 2017)

Last modified: 2017-02-20 10:00:00

Program search result : 日大生産工 : 6 programs

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Affillations (J) field begins with “日大生産工”, “Nihon U.”; 6 programs are found.
The search results are sorted by the start time.

TimePaper
ID
Title / AuthorsKeywordsTopic codeAck.
number
Day 2
9:209:40
I202[Requested talk] Destructive and Non-destructive testing for degradation of polymeric materials used in corrosive environment
(Tokyo Tech) *(Ful)Kubouchi Masatoshi, (Ful)Arao Yoshihiko, (Nihon U.) (Ful)Sakai Tetsuya
FRP
NDT
Degradation
F-2336
Day 3
9:2011:20
PD347Direct numerical simulation of crossflow microfiltration with particles/membrane surface layer of adsorbing solutes
(Nihon U.) *(Stu)Fujihira T., (Ful)Ando T., (U. Tokyo) (Ful)Tatsumi R., (PIA) (Ful)Koike O., (Kanagawa Inst. Tech.) (Ful)Ichimura S.
crossflow
solute adsorption
simulation
4-a599
Day 3
13:2015:20
PE308Measurement of the dielectric properties for propane + alcohol liquid mixtures and the correlation for the dielectric constants
(Nihon U.) *(Stu·PCEF)Koshiba Yusuke, (Ful)Hoshina Takaaki, (UTM) (Ful)Tsuji Tomoya, (Nihon U.) (Ful)Hiaki Toshihiko
dielectric constant
binary mixture
correlation
1-a223
Day 3
13:2015:20
PE324Measurement of mixing performance of bladeless stirrer using decolorization reaction method
(Nihon U.) *(Stu)Kageyama M., (Ful)Ando T., Aoki H., Itou K., (Aquatechs) Simoji Y., (Eddyplus) Murata K.
bladeless stirrer
mixing
decolorization
2-b675
Day 3
13:2015:20
PE334Promoting effect of flow by an obstacle in front of a pore on solid-liquid two phase flow
(Nihon U.) *(Stu)Honma Y., Neyama Y., (Ful)Ando T., (PIA) (Ful)Koike O., (U. Tokyo) (Ful)Tatsumi R.
obstacle
solid-liquid two phase flow
effect of streamline curvature
2-e591
Day 3
14:4015:00
E318Novel crystallization technique of double salt utilizing contact reaction of minute droplet with atmospheric plasmas
(Chiba Inst. Tech.) *(Ful)Wada Y., (Stu)Kobayashi T., (Ful)Onoe K., (Nihon U.) (Ful)Matsumoto M.
atmospheric plasma
minute-droplet
hydroxyapatite
12-g853

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SCEJ 82nd Annual Meeting (Tokyo, 2017)


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