Japanese page
SCEJ

SCEJ 82nd Annual Meeting (Tokyo, 2017)

Last modified: 2017-02-20 10:00:00

Program search result : TMCIT : 3 programs

The abstracts can be viewed by clicking the Paper IDs.
The ID/PW printed on the PROGRAM book are required.

Affillations field begins with “TMCIT”; 3 programs are found.
The search results are sorted by the start time.

TimePaper
ID
Title / AuthorsKeywordsTopic codeAck.
number
Day 2
10:4011:00
L206Improvement of durability and power by interface control by Nano particle deposition in SOFC
SOFC
nano particle
durability
9-a128
Day 2
13:2013:40
L214Research on Environmental Loading Reduction Effect Based on the Antioxidative Effect and/or Fluid Properties Change Action Derived from the Ionic Semiconductor
the Ionic Semiconductor
antioxidative effect
fluid properties change action
13-i227
Day 2
16:0016:20
L222Examination of the New Development of Manufacturing Equipment with the High-Precise Fluid Control Method for the Aqueous of Stabilization Hypochlorous Acid
the Aqueous of Stabilization Hypochlorous Acid
pasteurization effect
deodorization effect
13-i352

Technical program
Technical sessions (Wide)  (For narrow screen)
Session programs
Search in technical program
SCEJ 82nd Annual Meeting (Tokyo, 2017)


© 2023 The Society of Chemical Engineers, Japan. All rights reserved.
For more information contact SCEJ 82nd Annual Meeting Organizing Committee
E-mail: inquiry-82awww3.scej.org