SCEJ 82nd Annual Meeting (Tokyo, 2017)
Last modified: 2017-02-20 10:00:00
Program search result : Trace impurity : 1 program
The abstracts can be viewed by clicking the Paper IDs.
The ID/PW printed on the PROGRAM book are required.
The ID/PW printed on the PROGRAM book are required.
Keywords field exact matches “Trace impurity”; 1 program is found.
The search results are sorted by the start time.
| Time | Paper ID | Title / Authors | Keywords | Topic code | Ack. number |
|---|---|---|---|---|---|
| Day 1 | H114 | Prediction of terminal rise velocity of single bubble based on its surface fluctuation caused by liquid disturbance | Single bubble velocity Bubble surface fluctuation Trace impurity | 2-d | 158 |
Technical program
Technical sessions (Wide)
(For narrow screen)
Session programs
Search in technical program
SCEJ 82nd Annual Meeting (Tokyo, 2017)
© 2023 The Society of Chemical Engineers, Japan. All rights reserved.For more information contact SCEJ 82nd Annual Meeting Organizing Committee
E-mail: inquiry-82a
www3.scej.org