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SCEJ 48th Autumn Meeting (Tokushima, 2016)

Last modified: 2016-09-07 09:49:00

Hall and day program : Hall N

The third-day program of ST-12 (Hall D) was partly changed. ST-12 Program (The yellow-backed area is affected.)

Hall N(Bldg.4/5 2F 4-202)

Hall N, Day 1 | Hall N, Day 2 | Hall N, Day 3
SY-82 | SY-70 | SY-71

TimePaper
ID
Title / AuthorsKeywordsTopic codeAck.
number
Hall N(Bldg.4/5 2F 4-202), Day 1(Sep. 6)
SY-82 Symposium of Electronics Division: Materials and Process in Electronics
(11:00–11:20) (Chair: Kondo Kazuo)
11:0011:20N107Detection of cuprous ions by micro ring electrodes on a TSV side wall
(Osaka Pref. U.) *(Ful)Hoang Van Ha, (Ful)Kondo Kazuo
Cuprous detection
micro electrode
TSV
SY-82588
(11:20–12:00) (Chair: Orita Nobuaki)
11:2012:00N108[Invited lecture] Progress of the current distribution analysis technology of electrolytic cell
(MUSASHI GIKEN LLC.) (Div)Ohara Katsuhiko
electrolytic cell
current distribution analysis
calculation
SY-82650
(13:00–13:20) (Chair: Kondo Kazuo)
13:0013:20N113Fabrication of Fine-pitch Copper Wiring by Micro-contact Printing and Plating Using Nucleating Agent Ink
(AIST) *(Div)Tokoro K., Onoue M., Shirakawa N., Ushijima H., (Nissan Chemical Industries) (Cor)Kojima K., (Cor)Chikama K.
printed electronics
micro-contact printing
electrodeposition
SY-82101
(13:20–14:20) (Chair: Tokoro Kazuhiko)
13:2013:40N114NiFe Plating Film for Magnetic Sensor and Magnetic Compass
(Tosetz) *(Ful)Miyake Yuko, (Div)Shimizu Sanae, (Div)Matsui Kousuke, (Div)Maruyama Takafumi, (Div)Koizumi Yuichi
NiFe
electroplating
magnetic sensor
SY-82926
13:4014:00N115Advanced analysis of electroplating on patterned wafers
(Keisoku Eng. Sys.) *(Cor)Tong Lizhu, (Cor)Nagayama Tatsuhiko, (COMSOL AB) Henrik Ekstrom
Electroplating
Patterned wafer
Numerical analysis
SY-821
14:0014:20N116High speed Cu electrodeposition in φ12inch-wafer size electrodeposition apparatus
(Tosetz) *(Ful)Miyake Yuko, (Div)Koizumi Yuichi, (Div)Matsui Kousuke, (Div)Maruyama Takafumi
High speed Cu plating
electrodeposition
electrolytic plating apparatus
SY-82993
(14:40–15:20) (Chair: Orita Nobuaki)
14:4015:20N118[Invited lecture] The trend of Advance in Semiconductor package technology in IoT era
(Grobal Net) (Div)Takeno Yasuhiko
IoT
Semiconductor Package
3D
SY-82776
(15:20–16:40) (Chair: Takeno Yasuhiko)
15:2016:00N120[Invited lecture] Nano-Structure Controlled Very Low Resistivity Cu Wires By High Purity Plating
(Ibaraki U.) *Onuki Jin, Tamahashi Kunihiro, Itou Masahiko, Onuma Shigeharu, Inami Takashi, Namekawa Takashi, Honma Yoshio
Nano-level Cu Wire
High Purity Electrolyte
Microstructure Analysis
SY-82679
16:0016:40N122[Invited lecture] Determination of reaction rate constants of copper electrodeposition on a rotating disk electrode and using for simulation of the cuprous concentration inside TSVs
(Osaka Pref. U.) *(Ful)Hoang Van Ha, (Osaka Pref. U..) (Ful)Kondo Kazuo
Copper electrodeposition
TSV filling
cuprous
SY-82585
Hall N(Bldg.4/5 2F 4-202), Day 2(Sep. 7)
SY-70 Symposium of Division of Systems, Information and Simulation Technologies (3) Recent Research and Development of Process Systems Engineering
(9:00–10:40) (Chair: Kaneko Hiromasa, Ootakara Shigeki)
9:009:20N201Problem of improvement of process completion time in manufacturing systems with uncertainty and its solving method
(Nagoya U.) *(Stu)Imaoka Y., (Ful)Hashizume S., (Ful)Yajima T., (Aichi Inst. Tech.) (Ful)Onogi K.
improvement of process completion time
critical path
system with uncertainty
SY-70817
9:209:40N202On a method of calculating of degree towards which activity is pushing a due date of the whole project
(U. Miyazaki) *(Ful)Takatsuka Kayoko, (Ful)Yamaba Hisaaki, Kubota Shinichiro, Okazaki Naonobu
Scheduling management
DRAG
Float
SY-70608
9:4010:00N203Comparative evaluation of multi-product and multi-task manufacturing processes including reaction and separation
(Tokushima U.) *(Int)Alcantara A J. Rafael, (Ful)Sotowa Ken-Ichiro, (Ful)Horikawa Toshihide
Process modeling
multi-task manufacturing
reaction-separation systems
SY-70617
10:0010:20N204Methylcyclohexane dehydrogenation system applying heat waste
(AIST) *(Ful·PCEF)Atsumi Ryosuke, (Ful)Matsumoto Hideyuki, Kojima Hirokazu, Tsujimura Taku
Hydrogen energy
Methylcyclohexane
Process integration
SY-70812
10:2010:40N205Efficient analysis for Heat balance and online plant performance monitoring system
(Etech consulting) (Ful)Honda Tatsuho
enthalpy
heat balance
performance monitoring
SY-7026
(10:40–12:00) (Chair: Hashimoto Yoshihiro, Kawanabe Takeshi)
10:4011:00N206Real-Time Monitoring of Moisture Content in a Fluidized Bed Drying Process
(Morinaga Milk Ind.) *Inagaki Koji, (TUAT) (Ful)Yamashita Yoshiyuki
Fluidized Bed Drying
Near-Infrared Spectroscopy
Moisture
SY-70503
11:0011:20N207Real-Time Monitoring of Multiple Saccharides Concentration in a Simulated Moving-Bed Chromatography Process
(Morinaga Milk Ind.) *Inagaki Koji, (TUAT) (Ful)Yamashita Yoshiyuki
Near-Infrared Spectroscopy
Simulated Moving-Bed
Chromatography
SY-70508
11:2011:40N208Development of soft sensor tools for adaptive soft sensors and smoothing estimated values
(U. Tokyo) *(Ful)Kaneko Hiromasa, (Mitsui Chemicals) Ootakara Shigeki, (Ful)Matsumoto Takuya, (U. Tokyo) (Ful)Funatsu Kimito
soft sensor
offline analysis
online analysis
SY-7013
11:4012:00N209Visualization of abnormal status transition w/ time series clustering based on abnormal duration
(NEC) (Ful)Natsumeda Masanao
Clustering
Fault localization
Invariant networks
SY-70417
(13:00–14:40) (Chair: Tsuge Yoshifumi, Higuchi Fumitaka)
13:0013:20N213[The JCEJ Outstanding Paper Award] Optimal Structure Synthesis of Internally Heat Integrated Distillation Column
(Kyoto U.) *(Stu·PCEF)Takase Hiroshi, (Ful)Hasebe Shinji
Process Synthesis
Energy Saving
Linear Formulation
SY-7071
13:2013:40N214Gray-box modeling of 300 mm Czochralski single-crystal Si production process
(Kyoto U.) (Ful·PCEF)Seto Tatsuru, *(Ful·APCE)Kim Sanghong, (Ful)Kano Manabu, (SUMCO) (Ful)Fujiwara Toshiyuki, (Ful)Mizuta Masahiko, (Kyoto U.) (Ful)Hasebe Shinji
Czochralski process
Single-crystal silicon
Gray-box model
SY-70241
13:4014:00N215Flatness control method for silicon wafer by similarity
(SUMCO) *(Ful)Mizuta Masahiko, (Kyoto U.) (Ful)Kano Manabu
silicon wafer
flatness
similarity
SY-70346
14:0014:20N216Fault Identification by Variable Elimination-based Contribution: Its Application to Vinyl Acetate Monomer Plant
(Kyoto U.) *(Stu)Satoyama Yusuke, (Ful)Fujiwara Koichi, (Ful)Kano Manabu
fault identification
multivariate statistical process control
kernel principal component analysis
SY-70592
14:2014:40N217Application of Two-Degree-of-Freedom E-FRIT to Vinyl Acetate Monomer Plant
(Kyoto U.) *(Stu)Zhang Xinnuo, (Ful)Kano Manabu, (Azbil) (Ful)Ogawa Morimasa, (Tokyo Metro. U.) Masuda Shiro
two-degree-of-freedom PID control system
extended fictitious reference iterative tuning
data-driven controller tuning
SY-70594
(14:40–16:00) (Chair: Yamashita Yoshiyuki, Mizuta Masahiko)
14:4015:00N218Design of Flow Distributors and Collectors for Successful Blockage Diagnosis of Parallelized Microreactors
(Kyoto U.) *(Stu·PCEF)Tsuji R., (Stu·PCEF)Taga T., (Ful)Tonomura O., (Ful)Taniguchi S., (Ful)Hasebe S.
Microreactor blockage diagnosis
Flow distributor design
Sensor location
SY-70807
15:0015:20N219Developing Process Models of Hydrogen Peroxide Decontamination in Pharmaceutical Manufacturing
(U. Tokyo) *(Stu)Yabuta K., (Airex) Futamura H., (Ful)Kawasaki K., (U. Tokyo) (Ful)Hirao M., (Ful)Sugiyama H.
Process design
Sterile drug product manufacturing
Isolator
SY-70174
15:2015:40N220Process performance assessment based on stochastic simulation in sterile drug product manufacturing
(U. Tokyo) *(Stu)Casola Gioele, (Hoffmann-La Roche) Siegmund Christian, Mattern Markus, (U. Tokyo) (Ful)Sugiyama Hirokazu
Performance Assessment
Sterile Drug Product Manufacturing
Stochastic Simulation
SY-7015
15:4016:00N221Process systems engineering research on pharmaceutical continuous manufacturing
(U. Tokyo) *(Ful)Sugiyama Hirokazu, (Stu)Matsunami Kensaku
Pharmaceutical manufacturing
Continuous manufacturing
Process design
SY-7080
Hall N(Bldg.4/5 2F 4-202), Day 3(Sep. 8)
SY-71 Symposium of Division of Systems, Information and Simulation Technologies (4) 15th Process Design Contest for Students
(9:00–12:00) (Chair: Yamashita Yoshiyuki, Takeda Kazuhiro)
9:0012:00N30115th Process Design Student Contest
(TUAT) (Ful)Yamashita Yoshiyuki
process design
education
SY-7141
(14:00–16:00) (Chair: Suzuki Tsuyoshi, Sueyoshi Kazuo, Fuchino Tetsuo)
14:0016:00Remark, General Discussion, Awards Ceremony

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SCEJ 48th Autumn Meeting (Tokushima, 2016)


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